ENTRY PS79 0 PS79 0 1 SUBENT PS79 1 0 PS79 1 1 BIB 12 77 PS79 1 2 INSTITUTE (AULAML) PS79 1 3 REFERENCE (J,NP/A,331,389,1979) PS79 1 4 AUTHORS (B.M.PAINE,D.G.SARGOOD) PS79 1 5 TITLE (P,GAMMA) RESONANCE STRENGTHS IN THE S-D SHELL PS79 1 6 FACILITY (VDG) 5-MV PELLETRON ACCELERATOR, SCHOOL OF PHYSICS, PS79 1 7 UNIVERSITY OF MELBOURNE, PARKVILLE, VICTORIA, PS79 1 8 AUSTRALIA. PS79 1 9 INC-PART (P) PROTONS. PS79 1 10 TARGETS TARGET MATERIALS WERE EVAPORATED ONTO CARBON BACKINGS. PS79 1 11 NATURAL MATERIALS WERE USED WHERE THE MEASUREMENT WAS PS79 1 12 ON THE MOST COMMON ISOTOPE. OTHERWISE ENRICHED SAMPLES PS79 1 13 WERE USED. THE LATTER DID NOT APPLY FOR PHOSPHORUS PS79 1 14 WHICH IS MONOISOTOPIC. THE COMPOUND USED WAS NA4P2O7. PS79 1 15 EACH TARGET CONTAINED AT LEAST TWO OF THE ELEMENTS PS79 1 16 CONSIDERED SO STRENGTH RATIOS COULD BE DETERMINED. PS79 1 17 TARGETS FOR THE ABSOLUTE MEASUREMENTS WERE 99.999 PS79 1 18 PERCENT PURE ALUMINUM OF THICKNESS 47 MICROGRAM/CM**2 PS79 1 19 AND 99.7 PERCENT PURE SIO2 OF THICKNESS 23 MICROGRAM/ PS79 1 20 CM**2 ON 40 MICROGRAM/CM**2 CARBON FOILS. THE TARGET PS79 1 21 PREPARATION PROCEDURES ARE DISCUSSED IN AN EARLIER PS79 1 22 PAPER (B.M. PAINE ET AL., PHYS. REV C17, 1550, 1978). PS79 1 23 TARGET THICKNESSES WERE MEASURED BY RUTHERFORD PS79 1 24 SCATTERING OF PROTONS AT 0.985 MEV FOR THE ALUMINUM PS79 1 25 TARGET AND 1.000 MEV FOR THE 30SI ENRICHED TARGET. PS79 1 26 TARGETS WERE FOUND TO BE STABLE DURING MEASUREMENTS. PS79 1 27 BOTH THIN AND SEMI-THICK TARGETS WERE USED IN THIS PS79 1 28 EXPERIMENT. THE RUTHERFORD SCATTERING DETERMINATIONS PS79 1 29 WERE MADE BOTH BEFORE AND AFTER THE MEASUREMENTS. PS79 1 30 METHOD THE MEASUREMENT TECHNIQUES ARE DESCRIBED IN ANALYTIC PS79 1 31 TERMS IN SECTION 2.1 OF THE ORIGINAL PAPER. TARGETS PS79 1 32 WERE MOUNTED AT THE CENTER OF A 15.2-CM DIAMETER PS79 1 33 SCATTERING CHAMBER. A SHIELDED NAI(TL) SCINTILLATION PS79 1 34 DETECTOR WAS PLACED AT 125 DEGREES. A GE(LI) DETECTOR PS79 1 35 WAS SITUATED AT 90 DEGREES VERY CLOSE TO THE TARGET. PS79 1 36 CHARGED-PARTICLE BEAMS WERE PROVIDED BY THE MELBOURNE PS79 1 37 5-MV PELLETRON ACCELERATOR. DETAILS OF THE EXPERIMENT PS79 1 38 ARE DESCRIBED IN AN EARLIER PAPER (B.M. PAINE ET AL., PS79 1 39 PHYS. REV C17, 1550, 1978). TARGET COMPOSITION WAS PS79 1 40 DETERMINED BY RUTHERFORD SCATTERING. THE DETECTOR PS79 1 41 CALIBRATION PROCEDURES ARE DESCRIBED IN EARLIER PAPER. PS79 1 42 RESONANCES IN 27AL(N,GAMMA)28SI AT EP = 632 AND 992 PS79 1 43 KEV WERE CHOSEN AS STANDARDS TO NORMALIZE RESONANCE PS79 1 44 STRENGTH DATA. 3OSI(P,GAMMA)31P WAS EXAMINED AS A PS79 1 45 SECONDARY STANDARD. ABSOLUTE MEASUREMENTS WERE MADE PS79 1 46 WITH VERY CAREFUL CONTROL OF THE GEOMETRY. THE SOLID PS79 1 47 ANGLE OF THE CHARGED-PARTICLE DETECTOR WAS ESTABLISHED PS79 1 48 TO AN ACCURACY OF ABOUT 1.5 PERCENT. THE SETUP USED PS79 1 49 FOR ABSOLUTE MEASUREMENTS DIFFERED ONLY MODESTLY FROM PS79 1 50 THE ARRANGEMENT USED FOR RELATIVE MEASUREMENTS. FOR PS79 1 51 ABSOLUTE STUDIES RUTHERFORD BACKSCATTERING OF PROTONS PS79 1 52 WAS EMPLOYED. MEASUREMENTS FOR THE ALUMINUM TARGET PS79 1 53 WERE PERFORMED AT EP = 0.985 MEV WHILE THOSE FOR THE PS79 1 54 SILICON TARGET INVOLVED EP = 1.000 MEV. MEASUREMENTS PS79 1 55 WERE MADE BOTH BEFORE AND AFTER THE RESONANCE STRENGTH PS79 1 56 DETERMINATIONS. IN THE RELATIVE MEASUREMENTS, THE PS79 1 57 PROTON BEAM CURRENT WAS KEPT BELOW 0.6 MICROAMP AND PS79 1 58 THE ALPHA-PARTICLE BEAMS WERE KEPT BELOW 0.2 MICROAMP. PS79 1 59 HOWEVER, IN THE CASE OF THE ABSOLUTE MEASUREMENTS, THE PS79 1 60 PROTON BEAMS WERE KEPT BELOW 0.3 MICROAMP AND THE PS79 1 61 COLLECTED BEAM CHARGE WAS MONITORED WITH A CURRENT PS79 1 62 DIGITIZER TO AN ACCURACY OF ABOUT 1 PERCENT. THE PS79 1 63 PROTON BEAM ENERGY RESOLUTION WAS 230 EV AND THE PS79 1 64 EXCITATION FUNCTIONS WERE TRACED IN 0.25-KEV STEPS. PS79 1 65 DETECTORS (GELI) 70-CM**3 GE(LI) DETECTOR. PS79 1 66 (SCINT) 12.7-CM X 15.2-CM NAI(TL) SCINTILLATION PS79 1 67 CRYSTAL DETECTOR. PS79 1 68 (SOLST) 200 MICROMETER-THICK SILICON SURFACE PS79 1 69 BARRIER DETECTOR. PS79 1 70 MONITOR (CI) CURRENT INTEGRATOR WITH AN ACCURACY OF 1 PERCENT. PS79 1 71 CORRECTION NO CORRECTIONS WERE APPLIED FOR GAMMA-RAY ANGULAR PS79 1 72 DISTRIBUTION EFFECTS. CORRECTIONS WERE APPLIED FOR PS79 1 73 GAMMA-RAY BACKGROUND AND APERTURE SCATTERING. PS79 1 74 ERR-ANALYS THE ABSOLUTE ERROR IN GAMMA-RAY DETECTION EFFICIENCY PS79 1 75 WAS FOUND TO BE ABOUT 4 PERCENT. THE ERRORS IN RATIOS PS79 1 76 OF RESONANCE STRENGTHS ESTIMATED TO BE 2 PERCENT. FOR PS79 1 77 ABSOLUTE RESONANCE STRENGTH MEASUREMENTS, STATISTICAL PS79 1 78 ERROR WAS 3 PERCENT AND THE TOTAL ERROR WAS 6 PERCENT. PS79 1 79 ENDBIB 77 PS79 1 80 ENDSUBENT 1 PS79 199999 SUBENT PS79 2 0 PS79 2 1 BIB 2 10 PS79 2 2 REACTIONS A: 31P(P,GAMMA)32S PS79 2 3 B: 27AL(P,GAMMA)28SI PS79 2 4 C: 30SI(P,GAMMA)31P PS79 2 5 COMMENTS ABSOLUTE RESONANCE STRENGTHS ARE GIVEN. EP = THE PS79 2 6 RESONANCE PROTON ENERGY. S = RESONANCE STRENGTH = PS79 2 7 (2J+1)*GAM(P)*GAM(G)/GAM(T), WHERE J = RESONANCE PS79 2 8 SPIN, GAM(P) = PROTON WIDTH, GAM(G) = GAMMA-RAY PS79 2 9 WIDTH, AND GAM(T) = TOTAL WIDTH. S-ERR = ERROR IN PS79 2 10 S. MEASURED REACTION IS "A". STANDARDS ARE "B" AND PS79 2 11 "C". DATA OBTAINED FROM TABLE 3 IN ORIGINAL PAPER. PS79 2 12 ENDBIB 10 PS79 2 13 DATA 4 5 PS79 2 14 REACTION EP S S-ERR PS79 2 15 NO-DIM KEV EV EV PS79 2 16 A 642. 0.22 0.02 PS79 2 17 A 811. 0.93 0.12 PS79 2 18 B 632. 3.21 0.22 PS79 2 19 B 992. 23.2 1.6 PS79 2 20 C 620. 4.0 0.4 PS79 2 21 ENDDATA 7 PS79 2 22 ENDSUBENT 2 PS79 299999 ENDENTRY 2 PS799999999